Onto Innovations Inc
Onto Innovation Inc. is engaged in the design, development, manufacture, and support of process control tools that perform macro-defect inspection and 2D/3D optical metrology, lithography systems, and process control analytical software, which are used by bare silicon wafer manufacturers, semiconductor wafer fabricators, and advanced packaging manufacturers. Its products include automated metrology systems, integrated metrology systems, silicon wafer all-surface inspection/characterization, macro defect inspection, automated defect classification and pattern analysis, yield analysis, opaque film metrology, probe card test and analysis, advanced packaging lithography, process control software and yield management software. Its products are also used for process control in several other technology markets, including manufacturing of light emitting diodes, vertical-cavity surface-emitting lasers, micro-electromechanical systems, data storage, and industrial and scientific applications.
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